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INCH-POUND MIL-M-38510/101J 07 February 2003 SUPERSEDING MIL-M-38510/101H 30 October 2001
MILITARY SPECIFICATION MICROCIRCUITS, LINEAR, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
This specification is approved for use by all Departments and Agencies of the Department of Defense.
Inactive for new design after 13 July 1995.
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, operational amplifiers. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.3). 1.2 Part number. The complete part number shall be in accordance with MIL-PRF-38535, and as specified herein.. 1.2.1 Device types. The device types shall be as shown in the following: Device type 01 02 03 04 05 06 07 08 Circuit Single operational amplifier - internally compensated Dual operational amplifier - internally compensated Single operational amplifier - externally compensated Single operational amplifier - externally compensated Dual operational amplifier - externally compensated 1/ Dual operational amplifier - externally compensated 1/ Single operational amplifier, high speed Dual operational amplifier - internally compensated
1.2.2 Device class. The device class shall be the product assurance level as defined in MIL-PRF-38535.
______ 1/ Device types 05 and 06 may be monolithic, or they may consist of two separate, independent die. Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be use in improving this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43216-5000, by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
AMSC N/A DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
FSC 5962
MIL-M-38510/101J
1.2.3 Case outlines. The case outlines shall be designated in MIL-STD-1835 and as follows: Outline letter A 2/ B 2/ C D E F G H I P Z 2 Descriptive designator GDFP5-F14 or CDFP6-F14 GDFP4-14 GDIP1-T14 or CDIP2-T14 GDFP1-F14 or CDFP2-F14 GDIP1-T16 or CDIP2-T16 GDFP2-F16 or CDFP3-F16 MACY1-X8 GDFP1-F10 or CDFP2-F10 MACY1-X10 GDIP1-T8 or CDIP2-T8 GDFP1-G10 CQCC1-N20 Terminals 14 14 14 14 16 16 8 10 10 8 10 20 Package style Flat pack Flat pack Dual-in-line Flat pack Dual-in-line Flat pack Can Flat pack Can Dual-in-line Flat pack with gullwing leads Square leadless chip carrier
1.3 Absolute maximum ratings. Supply voltage range (VCC)............................................................................. 22 V dc 3/ Input voltage range ......................................................................................... 20 V dc 4/ Differential input voltage range ....................................................................... 30 V dc 5/ Input current range ......................................................................................... -0.1 mA to +10 mA Storage temperature range ............................................................................. -65C to +150C Output short-circuit duration ............................................................................ Unlimited 6/ Lead temperature (soldering, 60 seconds) ..................................................... +300C Junction temperature (TJ) ............................................................................... +175C 7/ 1.4 Recommended operating conditions. Supply voltage (VCC) ...................................................................................... 5 V dc to 20 V dc Ambient temperature range (TA) .................................................................... -55C to +125C
______ 2/ Inactive package case outline. 3/ Voltages in excess of these may be applied for short-term tests if voltage difference does not exceed 44 volts. 4/ For supply voltages less than 20 V dc, the absolute maximum input voltage is equal to the supply voltage. 5/ For device types 04, 06, and 07 only, this rating is 1.0 V unless resistances of 2 k or greater are inserted in series with the inputs to limit current in the input shunt diodes to the maximum allowable value. 6/ Short circuit may be to ground or either supply. Rating applies to +125C case temperature or +75C ambient temperature. 7/ For short term test (in the specific burn-in and life test configuration when required and up to 168 hours maximum) TJ = +275C. 2
MIL-M-38510/101J
1.5 Power and thermal characteristics. Case outlines A,B,D C,E,P G I H F Z 2 Maximum allowable power dissipation 350 mW at TA = +125C 400 mW at TA = +125C 330 mW at TA = +125C 350 mW at TA = +125C 330 mW at TA = +125C 400 mW at TA = +125C 330 mW at TA = +125C 8/ at TA = +125C Maximum Maximum
JC
60C/W 35C/W 40C/W 40C/W 60C/W 35C/W 21C/W 60C/W
JA
140C/W 120C/W 150C/W 140C/W 150C/W 120C/W 225C/W still air 142C/W 500 LFPM 120C/W
2. APPLICABLE DOCUMENTS 2.1 Government documents. 2.1.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard for Microelectronics. - Interface Standard Electronic Component Outlines.
(Copies of these documents are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094 or http://astimage.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil.) 2.2 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein the text of this document shall takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained.
______ 8/ PD = 102 mW for device type 01. PD = 75 mW for device type 03. PD = 149 mW for device type 04.
3
MIL-M-38510/101J
3. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.4). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. 3.3.1 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity (DSCC-VAS) upon request. 3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3. 3.4 Lead material and finish. Lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.5 Electrical performance characteristics. The following electrical performance characteristics apply over the full operating ambient temperature range of -55C to +125C and for supply voltages 5 V dc to 20 V dc, unless otherwise specified (see table I). 3.5.1 Offset null circuits. Each amplifier having nulling inputs (device types 01, 02, 03, 05, and 07) shall be capable of being nulled 1 mV beyond the specified offset voltage limits for -55C TA +125C using the circuits of figure 2. 3.5.2 Frequency compensation. Device types 01, 02, 07, and 08 shall be free of oscillation when operated in a unity gain non-inverting mode with no external compensation and a source resistance of 10 k, and when operated in any test condition specified herein. Device types 03, 04, 05, and 06 shall be free from oscillation when compensated with a 30 pF capacitor for all gain configurations or a 3 pF capacitor when used with a gain of 10. 3.6 Rebonding. Rebonding shall be in accordance with MIL-PRF-38535. 3.7 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III. 3.8 Marking. Marking shall be in accordance with MIL-PRF-38535. 3.9 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 49 (see MIL-PRF-38535, appendix A).
4
MIL-M-38510/101J TABLE I. Electrical performance characteristics. 1/ Conditions -55C TA +125C see figure 3 unless otherwise specified Input offset voltage VIO RS = 50 2/ 1 01,02, 08 03,05 04,06 07 2,3 01,02, 08 03,05 04,06 07 Input offset voltage temperature sensitivity VIO / T 2 01,02, 08 03,05 04,06 07 3 01,02, 03,05 04,06 07 08
Test
Symbol
Group A subgroups
Device type Min -3 -2 -0.5 -4 -4 -3 -1 -6 -15
Limits Max +3 +2 +0.5 +4 +4 +3 +1 +6 +15
Unit
mV
V/C
-18 -5 -50 -15 -5 -50 -20
+18 +5 +50 +15 +5 +50 20
See footnotes at end of table.
5
MIL-M-38510/101J TABLE I. Electrical performance characteristics - Continued. 1/ Conditions -55C TA +125C see figure 3 unless otherwise specified Input offset current IIO 2/ 1 01,02, 08 03,05 04,06 07 2,3 01,02, 08 03,05 04,06 07 Input offset current temperature sensitivity IIO / T 2 01,02, 08 03,05 04,06 07 3 01,02, 08 03,05 04,06 07
Test
Symbol
Group A subgroups
Device type Min -30 -10 -0.2 -40 -70 -20 -0.4 -80
Limits Max +30 +10 +0.2 +40 +70 +20 +0.4 +80 +500
Unit
nA
-500
pA/C
-200 -2.5 -1000 -200 -100 -2.5 -1000
+200 +2.5 +1000 +200 +100 +2.5 +1000
See footnotes at end of table.
6
MIL-M-38510/101J TABLE I. Electrical performance characteristics - Continued. 1/ Conditions -55C TA +125C see figure 3 unless otherwise specified Input bias current +IIB 2/ 1,2 01,02, 08 03,05 07 1 2 3 01,02, 08 03,05 04,06 07 -IIB 1,2 01,02, 08 03,05 07 1 2 3 01,02, 08 03,05 04,06 07 04,06 04,06
Test
Symbol
Group A subgroups
Device type Min -0.1 -0.1 -0.1 -0.1 -1.0 -0.1 -0.1 -0.1 -0.1 -0.1 -0.1 -0.1 -0.1 -1.0 -0.1 -0.1 -0.1 -0.1
Limits Max +110 +75 +250 +2.0 +2.0 +265 +100 +3.0 +400 +110 +75 +250 +2.0 +2.0 +265 +100 +3.0 +400
Unit
nA
See footnotes at end of table. 7
MIL-M-38510/101J TABLE I. Electrical performance characteristics - Continued. 1/ Conditions -55C TA +125C see figure 3 unless otherwise specified Power supply rejection ratio +PSRR +VCC = 10 V, RS = 50 , 1 01,02, 03,05, 08 04,06 07 2,3 01,02, 03,05, 08 04,06 07 -PSRR +VCC = 20 V, RS = 50 , 1 01,02, 03,05, 08 04,06 07 2,3 01,02, 03,05, 08 04,06 07 Input voltage common mode rejection CMR VCC = 20 V, VIN = 15 V, RS = 50 1,2,3 01,02, 03,05, 07,08 04,06
Test
Symbol
Group A subgroups
Device type Min -50
Limits Max +50
Unit
V/V
-VCC = -20 V
-16 -100 -100
+16 +100 +100
-16 -150 -50
+16 +150 +50
-VCC = -10 V
-16 -100 -100
+16 +100 +100
-16 -150 80
+16 +150 dB
96
See footnotes at end of table.
8
MIL-M-38510/101J TABLE I. Electrical performance characteristics - Continued. 1/ Conditions -55C TA +125C see figure 3 unless otherwise specified Adjustment for input 3/ offset voltage VIO ADJ(+) VCC = 20 V 1,2,3 01,02, 08 03,05 04,06
Test
Symbol
Group A subgroups
Device type Min +5 +4
Limits Max
Unit
mV
No external ADJ +7 -5 -4 No extern al ADJ -7 -60 mA mV
07 Adjustment for input 3/ offset voltage VIO ADJ(-) VCC = 20 V 1,2,3 01,02, 08 03,05 04,06
07 Output short-circuit current (for positive output) IOS(+) VCC = 15 V, t 25 ms 4/ 1,2,3 01,02, 03,05, 08 04,06 07 Output short-circuit current (for negative output) 1,2 3 IOS(-) VCC = 15 V, t 25 ms 4/ 1,2,3 01,02, 03,05, 08 04,06 07
-15 -65 +60 mA
+15 +65 +80
See footnotes at end of table.
9
MIL-M-38510/101J TABLE I. Electrical performance characteristics - Continued. 1/ Conditions -55C TA +125C see figure 3 unless otherwise specified Supply current ICC VCC = 15 V 5/ 1 01,02, 08 03,05 04,06 07 2 01,02, 08 03,05 04,06 07 3 01,02, 08 03,05 04,06 07 Output voltage swing (maximum) VOP VCC = 20 V, RL = 10 k 4,5,6 01-06, 08 07 VCC = 20 V, RL = 2 k 01,02, 03,05, 08 04,06 16 17 15
Test
Symbol
Group A subgroups
Device type Min
Limits Max +3.8 +3 +0.6 +8 +3.4 +2.5 +0.6 +7 +4.2 +3.5 +0.8 +9 V
Unit
mA
Not specified 16
07
See footnotes at end of table. 10
MIL-M-38510/101J TABLE I. Electrical performance characteristics - Continued. 1/ Conditions -55C TA +125C see figure 3 unless otherwise specified Open loop voltage gain 6/ (single ended) AVS() VCC = 20 V, 7/ RL = 2 k, 10 k VOUT = 15 V 5,6 4 01,02, 03,05, 07,08 04,06 01,02, 03,05, 08 04,06 07 Open loop voltage gain 6/ (single ended) AVS VCC = 5 V, 7/ RL = 2 k, 10 k VOUT = 2 V Transient response rise time TR(tr) See figure 4 8/ 7,8A,8B 4,5,6 01,02, 03,05, 07,08 04,06 01,02, 03,05, 08 04,06 07 Transient response overshoot TR(OS) See figure 4 8/ 7,8A,8B 01,02, 03,05, 08 04,06, 07 Slew rate 9/ SR(+) VIN = 5 V, AV = 1, see figure 4 7,8B 01,02, 08 03,05 04,06 07 +0.3 10/ +0.05 +40
Test
Symbol
Group A subgroups
Device type Min 50
Limits Max
Unit
V/mV
80 25
40 32 10 V/mV
20 +800 ns
+1000 +40 +25 %
+50 V/s
See footnotes at end of table.
11
MIL-M-38510/101J TABLE I. Electrical performance characteristics - Continued. 1/ Conditions -55C TA +125C see figure 3 unless otherwise specified Slew rate 9/ SR(+) VIN = 5 V, AV = 1, see figure 4 8A 01,02, 03,05, 08 04,06 07 Slew rate 9/ SR(-) VIN = 5 V, AV = 1, see figure 4 7,8B 01,02, 08 03,05 04,06 07 8A 01,02, 03,05, 08 04,06 07 Settling time 11/ tS(+) See figure 4 12 13A,13B tS(-) 12 13A,13B Channel separation CS VCC = 20 V, see figure 5, TA = +25C See footnotes at end of table. 7 02,05, 06,08 80 07
Test
Symbol
Group A subgroups
Device type Min
Limits Max
Unit
+0.3
V/s
+0.05 +30 +0.3 10/ +0.05 +40 +0.3 V/s
+0.05 +30 800 1200 800 1200 dB ns
12
MIL-M-38510/101J TABLE I. Electrical performance characteristics - Continued. 1/ Conditions -55C TA +125C see figure 3 unless otherwise specified Noise (referred to input) broadband NI(BB) VCC = 20 V, TA = +25C, bandwidth = 5 kHz 7 01-06, 08 07 Noise (referred to input) popcorn NI(PC) VCC = 20 V, TA = +25C, bandwidth = 5 kHz 7 01,02, 04,06, 08 03,05, 07
Test
Symbol
Group A subgroups
Device type Min
Limits Max 15 25 40
Unit
Vrms
Vpk
80
1/
For devices marked with the "Q" certification mark, the parameters listed herein maybe guaranteed if not tested to the limits specified herein in accordance with the manufacturer's QM plan. Tests at common mode VCM = 0 V, VCM = -15 V, and VCM = +15 V. VIO(ADJ) is not performed on device type 02, case I only, or on device type 08 for either case G or P. Continuous short circuit limits will be considerably less than the indicated test limits. Continuous IOS at TA +75C will cause TJ to exceed the maximum of +175C. For dual devices, IOS is measured one channel at a time.
2/ 3/ 4/
5/
Value shown is for single devices (01, 03, 04) only. For dual devices (02, 05, 06, and 08) this limit is for single devices. Note that gain is not specified at VIO(ADJ) extremes. Some gain reduction is usually seen at VIO(ADJ) extremes. For closed loop applications (closed loop gain less than 1,000), the open loop tests (AVS) prescribed herein should guarantee a positive, reasonably linear, transfer characteristic. They do not, however, guarantee that the open loop gain is linear, or even positive, over the operating range. If either of these requirements exist (positive open loop gain or open loop gain linearity), they should be specified in the individual procurement document as additional requirements. RL = 10 k only for device types 04 and 06. For transient response tests, CF = 10 pF for device types 01, 02, 03, 04, 05, 06, and 08. Device type 07, CF = 47 pF. CF includes the effects of stray capacitance.
6/
7/ 8/
9/ 10/ 11/
Minimum limit for device 08 is 0.4 V/s at all temperatures. Minimum limits for device types 03 and 05 are 0.2 V/s at -55C and 0.3 V/s at both +25C and +125C. Settling time is waived for method 5004, MIL-STD-883 except for device type 07.
13
MIL-M-38510/101J TABLE II. Electrical test requirements. MIL-PRF-38535 test requirements Subgroups (see table III) Class S devices Interim electrical parameters Final electrical test parameters 1/ Group A test requirements 1 1,2,3,4 1,2,3,4,5,6, 7,8A,8B,12, 13A,13B 1,2,3, and table IV delta limits Not applicable 1,2,3 1 1,2,3,4 1,2,3,4,5,6,7 Class B devices
Group C end point electrical parameters Additional electrical subgroups For group C periodic inspections Group D end point electrical parameters 1/ PDA applies to subgroup 1. 4. VERIFICATION.
1 and table IV delta limits 8A,8B,12, 13A,13B 1
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply: a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer. Additional screening for space level product shall be as specified in MIL-PRF-38535.
b.
c.
14
MIL-M-38510/101J
Device type Case outlines Terminal number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 A,B,C,D G and P
01 H 2
Terminal symbol NC NC OFFSET NULL -INPUT +INPUT -VCC NC NC OFFSET NULL OUTPUT +VCC NC NC NC ------------OFFSET NULL -INPUT +INPUT -VCC OFFSET NULL OUTPUT +VCC NC ------------------------NC OFFSET NULL -INPUT +INPUT -VCC OFFSET NULL OUTPUT +VCC NC NC --------------------NC OFFSET NULL (-) NC NC -INPUT NC +INPUT NC NC -VCC NC OFFSET NULL (+) NC NC OUTPUT NC +VCC NC NC NC
NC = No connection FIGURE 1. Terminal connections.
15
MIL-M-38510/101J
Device type Case outlines Terminal number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 A,B,C,D
02 I C Terminal symbol -INPUT A +INPUT A OFFSET NULL A -VCC OFFSET NULL B +INPUT B -INPUT B OFFSET NULL B +VCC (B) SEE NOTE 2 OUTPUT B NC OUTPUT A +VCC (A) SEE NOTE 2 OFFSET NULL A ------------OUTPUT A +VCC (A) SEE NOTE 2 -INPUT A +INPUT A -VCC +INPUT B -INPUT B +VCC (B) SEE NOTE 2 OUTPUT B NC --------------------NC NC OFFSET NULL / COMP -INPUT +INPUT -VCC NC NC OFFSET NULL OUTPUT +VCC COMP NC NC -------------
03 G and P H
OFFSET NULL / COMP -INPUT +INPUT -VCC OFFSET NULL OUTPUT +VCC COMP -------------------------
NC OFFSET NULL / COMP -INPUT +INPUT -VCC OFFSET NULL OUTPUT +VCC COMP NC ---------------------
NC = No connection
FIGURE 1. Terminal connections - Continued.
16
MIL-M-38510/101J
Device type Case outlines Terminal number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20
03 2 C G and P
04 H 2
Terminal symbol NC OFFSET NULL (-) NC NC -INPUT NC +INPUT NC NC -VCC NC OFFSET NULL (+) NC NC OUTPUT NC +VCC NC NC FREQ COMP NC INPUT COMP GUARD -INPUT +INPUT GUARD -VCC NC NC OUTPUT +VCC OUTPUT COMP NC NC ------------INPUT COMP -INPUT +INPUT -VCC NC OUTPUT +VCC OUTPUT COMP ------------------------NC GUARD -INPUT +INPUT GUARD -VCC OUTPUT +VCC OUTPUT COMP INPUT COMP --------------------NC INPUT COMP NC NC -INPUT NC +INPUT NC NC -VCC NC NC NC NC OUTPUT NC +VCC NC NC OUTPUT COMP
NC = No connection
FIGURE 1. Terminal connections - Continued.
17
MIL-M-38510/101J
Device type Case outlines Terminal number 1
05 E and F
06 E and F Terminal symbol C
07 G and P
+VCC (A) SEE NOTE 5 COMP A OFFSET NULL / COMP -INPUT A +INPUT A
+VCC (A) SEE NOTE 5 OUTPUT COMP A INPUT COMP A -INPUT A +INPUT A
NC
2 3 4 5
NC COMP A / OFFSET NULL -INPUT +INPUT
COMP A / OFFSET NULL -INPUT +INPUT -VCC COMP B / OFFSET NULL OUTPUT +VCC COMP C -----------------
6 7 8 9 10 11 12 13 14 15 16
-VCC OFFSET NULL B OUTPUT B +VCC (B) SEE NOTE 5 COMP B OFFSET NULL / COMP B -INPUT B +INPUT B OFFSET NULL A NC OUTPUT A
-VCC NC OUTPUT B +VCC (B) SEE NOTE 5 OUTPUT COMP B INPUT COMP B -INPUT B +INPUT B NC NC OUTPUT A
-VCC NC NC COMP B / OFFSET NULL OUTPUT +VCC COMP C NC NC -----
NC = No connection
FIGURE 1. Terminal connections - Continued.
18
MIL-M-38510/101J
Device types Case outlines Terminal number 1 2 3 4 5 6 7 8 9 10
07 H
08 G and P
Terminal symbol NC COMP A / OFFSET NULL -INPUT +INPUT -VCC COMP B / OFFSET NULL OUTPUT +VCC COMP C NC OUTPUT A -INPUT A +INPUT A -VCC +INPUT B -INPUT B OUTPUT B +VCC -----
NC = No connection
NOTES: 1. 2. 3. 4. 5. -VCC shall be connected to case of metal packages. For device type 02 only, +VCC (A) and +VCC (B) shall be internally connected. +Input is non-inverting input. -Input is inverting input. For device types 05 and 06 only, +VCC (A) and +VCC (B) shall not be internally connected. (External connection to the same supply voltage recommended).
FIGURE 1. Terminal connections - Continued.
19
MIL-M-38510/101J
FIGURE 2. Offset null circuits. 20
MIL-M-38510/101J
Device type 07
FIGURE 2. Offset null circuits - Continued. 21
MIL-M-38510/101J
FIGURE 3. Test circuit for static and dynamic tests. 22
Parameter
Apply (in volts)
Switch position
Measure
Measured parameter 20/
Units
+VCC
-VCC S1
V S2 S3 S4 S5 S6 Value Equation
Units
VIO
35 5 20 5 VIO = E1, E2, E3, E4 35 5 20 5 35 5 20 5 35 5 20 5 10 -20 5 1 1 1 1 1 1 E18 1/ V -5 -35 -20 -5 -15 15 0 0 1 1 1 1 1 1 1 1 2 2 2 2 1 1 1 1 1 1 1 1 1 1 1 1 E13 E14 E15 E16 V -5 -35 -20 -5 -15 15 0 0 1 1 1 1 2 2 2 2 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 E9 E10 E11 E12 V -5 -35 -20 -5 -15 15 0 0 1 1 1 1 2 2 2 2 2 2 2 2 1 1 1 1 1 1 1 1 1 1 1 1 E5 E6 E7 E8 V 6 6 IIO = ((E1 - E5) X 10 ) / RS, ((E2 - E6) X 10 ) / RS, 6 6 ((E3 - E7) X 10 ) / RS, ((E4 - E8) X 10 ) / RS
-5 -35 -20 -5
-15 15 0 0
1 1 1 1
1 1 1 1
1 1 1 1
1 1 1 1
1 1 1 1
1 1 1 1
E1 E2 E3 E4
V
mV
IIO
13/
nA
+IIB
6 6 +IIB = ((E1 - E9) X 10 ) / RS, ((E2 - E10) X 10 ) / RS, 6 6 ((E3 - E11) X 10 ) / RS, ((E4 - E12) X 10 ) / RS
13/
nA
-IIB
6 6 -IIB = ((E13 - E1) X 10 ) / RS, ((E14 - E2) X 10 ) / RS, 6 6 ((E15 - E31) X 10 ) / RS, ((E16 - E4) X 10 ) / RS 2 +PSRR = (E3 - E18) X 10
13/
nA
+PSRR
V/V 2 -PSRR = (E3 - E19) X 10
MIL-M-38510/101J
FIGURE 3. Test circuit for static and dynamic tests- Continued.
20 -10 -5 1 1 1 1 1 1 E19 1/ V 35 5 -5 -35 -15 +15 1 1 1 1 1 1 1 1 1 1 1 1 E1 1/ E2 1/ V V 20 -20 0 1 1 1 2 1 1 E20 V VIO ADJ (+) = (E3 - E20) 20 -20 0 1 1 1 3 1 1 E21 V VIO ADJ (-) = (E3 - E21) 20 -20 0 1 1 1 4 1 1 E22 V VIO ADJ (+) = (E3 - E22) 20 -20 0 1 1 1 5 1 1 E23 V VIO ADJ (-) = (E3 - E23) 20 -20 0 1 1 1 6 1 1 E34 V VIO ADJ (+) = (E3 - E34) 20 -20 0 1 1 1 7 1 1 E35 V VIO ADJ (-) = (E3 - E35)
23
-PSRR
V/V
CMR
3 CMR = 20 LOG |(30 X 10 ) / (E1 - E2)|
dB
VIO 7/ ADJ(+)
mV
VIO 7/ ADJ(-)
mV
VIO 6/ ADJ(+)
mV
VIO 6/ ADJ(-)
mV
VIO 15/ ADJ(+)
mV
VIO 15/ ADJ(-)
mV
Parameter
Apply (in volts)
Switch position
Measure
Measured parameter 20/
Units
+VCC
-VCC S1 Value Equation
V
S2
S3
S4
S5
S6
Units
+IOS (output) +IOS -= IOS1 -IOS (output) ICC ICC (E0)1 +VOP = (E0)1 V 20 -20 -20 1 1 1 1 2 1 15 ICC = ICC -15 1 0 1 1 1 1 1 mA 15 IOS2 -IOS = IOS2 -15 +15 1 1 1 1 1 2 mA mA
15 IOS1
-15 1 mA
-15
1
1
1
1
2
mA
mA
+VOP RL = 10 k -VOP RL = 10 k +VOP RL = 2 k -VOP RL = 2 k +AVS 16/ RL = 2 k -AVS 16/ RL = 2 k AVS 16/ RL = 2 k +AVS 16/ RL = 10 k -AVS 16/ RL = 10 k AVS 16/ RL = 10 k CMR 3/ 20 20 -20 -20 5 5 -5 -5 -2 +2 1 1 1 1 1 1 1 1 2 2 1 1 E32 E33 V AVS = 4 / (E33 - E32) 20 -20 +15 1 1 1 1 2 1 E31 V 20 -20 -15 1 1 1 1 5 5 -5 -5 -2 +2 1 1 1 1 1 1 1 1 3 3 1 1 E26 E27 V AVS = 4 / (E27 - E26) 20 -20 1 +15 1 1 1 3 1 E25 V 20 E24 -20 -15 1 1 1 1 3 1 V 20 (E0)4 -20 +20 1 1 1 1 3 1 V -VOP = (E0)4 20 (E0)3 -20 1 -20 1 1 1 3 1 V +VOP = (E0)3 20 (E0)2 -20 +20 1 1 1 1 2 1 V -VOP = (E0)2
V
V
V
MIL-M-38510/101J
FIGURE 3. Test circuit for static and dynamic tests- Continued.
+AVS = 15 / (E3 - E24) -AVS = 15 / (E25 - E3) 2 1 E30 V +AVS = 15 / (E3 - E30) -AVS = 15 / (E31 - E3) +15 -15 2 2 1 1 1 1 1 1 1 1 1 1 E28 1/ E29 1/ V CMR = 20 log |(30 x 10 ) / (E28 - E29)|
3
24
V
V/mV
V/mV
V/mV
V/mV
V/mV
V/mV
MIL-M-38510/101J NOTES: 1/ 2/ These voltages in mV shall be measured to four place accuracy to provide required resolution in PSRR and CMR. Precautions shall be taken to prevent damage to the device under test during insertion into socket and change of switch positions (example, disable voltage supplies, current limit VCC, etc.). If this alternate CMR test is used, these resistors shall be of .01 percent tolerances matched to .001 percent. Device types 02, 05, and 06 only, test both halves for all tests. The idle half of the dual amplifiers shall be maintained in this configuration where V1 is midway between +VCC and -VCC, or the manufacturer has the option to connect the idle half in a VIO configuration such that the inputs are maintained at the same common mode voltage as the device under test. Compensation: for device types 03, 04, 05, and 06 only, equals 30 pF; for device type 07 only, equals 330 pF (optional). Device types 01, all case types, and device type 02, case outlines A, B, C, and D only. Device types 03 and 05 only. See figure 6. Noise test circuit. As required, if needed to prevent oscillation. Also, proper wiring procedures shall be followed to prevent oscillation. Loop response and settling time shall be consistent with the test rate such that any value has settled for at least five loop time constants before the value is measured.
3/ 4/
5/ 6/ 7/ 8/ 9/
10/ Adequate settling time shall be allowed such that each parameter has settled to within five percent of its final value. 11/ The nulling amplifier is an M38510/10101XXX. Saturation of the nulling amplifier is not allowed on test where the "E" value is measured. 12/ All resistors 0.1 percent tolerance except as noted (note 3). 13/ For device types 01, 02, 07, and 08: RS = 20 k. For device types 03 and 05: RS = 100 k. For device types 04 and 06: RS = 5.0 M. 14/ Device type 07 only, this capacitor = 1,000 pF maximum to prevent oscillations. 15/ Device type 07 only. 16/ To minimize thermal drift, the reference voltages for gain measurements (E3 and E4) shall be taken immediately prior to or after the reading corresponding to device gain (E24, E25, E26, E27, E30, E31, E32, and E33). The gain at RL = 10 k is essentially the gain at RL = 2 k is influenced by thermal gradients on the die resulting from power dissipation in the output stage. Hence, it is not linear and may not even be a true approximation of the gain between other than the specified operation points. 17/ Any oscillation greater that 300 mV in amplitude (pk - pk) shall be cause for device failure. 18/ Although switches are depicted as toggle switches, any switching mechanism may be used provided the switching action is achieved without adversely affecting the measurement. 19/ The load resistors (2,050 and 11.1 k) yield effective load resistances of 2 k and 10 k, respectively. 20/ The equations take into account both the loop gain of 1,000 and the scale factor multiplier, so that the calculated value is in table III units. Therefore, use measured value / units in the equations, example E1 (volts). FIGURE 3. Test circuit for static and dynamic tests- Continued. 25
MIL-M-38510/101J
See notes on page 29 Parameter Rise time (tr) AV = 1 Overshoot (OS) AV = 1 Bandwidth (BW) AV = 1 Slew rate (+SR) AV = 1 Slew rate (-SR) AV = 1 Pulse generator +50 mV amplitude +50 mV amplitude +50 mV amplitude -5 V to +5 V step Measure t (s), see waveform 1 V (mV), see waveform 1 Calculate VO (volts), t (s) see waveform 2 VO (volts), t (s) see waveform 3 Equation tr = t OS = (V / 50) x 100 BW = 0.35 / tr (s) +SR = |VO(+) / t(+)| Units s % MHz V/s
+5 V to -5 V step
-SR = |VO(-) / t(-)|
V/s
FIGURE 4. Transient response test circuit. 26
MIL-M-38510/101J
See notes on page 30 Parameter Rise time (tr) Overshoot (OS) Bandwidth (BW) Slew rate (+SR) Pulse generator +50 mV amplitude +50 mV amplitude +50 mV amplitude -5 V to +5 V step Measure t (ns), see waveform 1 V (mV), see waveform 1 Calculate VO (+) (volts), t (+) (ns) see waveform 2 VO (-) (volts), t (-) (ns) see waveform 3 tS(+), see waveform 2 tS(-), see waveform 3 Equation tr = t OS = (V / 50) x 100 BW = (0.35 x 10 ) / tr (ns) +SR = |VO(+) / t(+) x 10 |
-3 -3 3
Units ns % MHz V/s
Slew rate (-SR)
+5 V to -5 V step
-SR = |VO(-) / t(-) x 10 |
V/s
Settling time tS(+) 5/ Settling time tS(-) 5/
-5 V to +5 V step +5 V to -5 V step
tS(+) = tS(+) tS(-) = tS(-)
ns ns
FIGURE 4. Transient response test circuit - Continued. 27
MIL-M-38510/101J (Alternate) device type 07
NOTES: 1. K1 is closed for small tests (Tr and P.O.) and is open for large signal tests ( slew rate, Ts). 2. Input signal is a -50 mV to 0 mV pulse train for small signal tests and -5 V to +5 V pulse train for large signal tests. 3. Tr of the input signal is < 10 ns for the small signal tests.
FIGURE 4. Transient response test circuit - Continued. 28
MIL-M-38510/101J
NOTES: 1. 2. 3. 4. 5. 6. 7. 8. 9. Idle half of dual amplifier shall be connected during test of other half. All resistor tolerances are 1 percent, capacitor tolerances are 10 percent and VCC = 20 V. This compensation capacitor is used for device types 03, 04, 05, and 06. For device types 01, 02, 03, 05, and 08, RL = 2 k; for device types 04 and 06, RL = 10 k. Settling time is the interval from the beginning of the output response to the point where the output remains within the error band, in this case 2 percent. CF = 10 pF 10 percent includes stray capacitance. R1 may be added to the circuit. When R1 is added, its value shall be 10 k. When using R1, the unity gain will increase to 2. To accommodate this change in gain, the pulse generator input shall be halved. C1 may be added to the circuit. When added, it shall be within the range of 0 pF to 2 pF. CL capacitance specified includes stray, jig, and probe capacitance. FIGURE 4. Transient response test circuit - Continued. 29
MIL-M-38510/101J Device types 02, 05, 06, and 08 only.
NOTES: 1. 2. 3. 4. 5. VCC = 20 V. Measure: V02 (volts, p-p) at 1 kHz to accuracy of 0.1 mV or better. Channel separation (dB) referred to input of second channel = 20 log [V01 / (0.1 x V02) ]. All resistor tolerances 1 percent. A 30 pF compensation capacitor is required for device types 05 and 06.
FIGURE 5. Test circuit for channel separation. 30
MIL-M-38510/101J
Noise (Referred to input) Broadband Popcorn
Symbol
S1
Measure Value Units mV rms mV pk
Measured equation
Parameter units V rms V pk
N1(BB) N1(PC)
Closed Open
E0 E0
E0 / 1000 E0 / 1000
NOTES: 1. 2. RS = 20 k for device types 01, 02, 07, and 08; RS = 100 k for device types 03, 04, 05, and 06. E0 is measured using an RMS voltmeter with a bandwidth of 10 Hz to 5 kHz and a peak detector simultaneously. Monitor the peak test for a minimum of 15 seconds. The loop bandwidth shall be at least 5 kHz.
FIGURE 6. Noise test circuit. 31
Subgroup -883 VCC = 20 V dc, figure 3 unless otherwise specified 1 VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V +VCC = 10 V, -VCC = -20 V +VCC = 20 V, -VCC = -10 V VCM = +15 V 3/ 3/ " " -0.1 " " " -50 -50 80 +5 -5 " -0.1 110 " " " 110 " " " +50 +50 " " " -0.1 " " " -0.1 " " " -50 -50 80 +4 -4 " " " " " " " " " 75 " " " 75 " " " +50 +50 -30 +30 -10 +10 -0.2 " " " -0.1 " " " -0.1 " " " -16 -16 96 " " " " " " " " " " " " +0.2 " " " +2.0 " " " +2.0 " " " +16 +16 " " " " " " " " " -40 " " " -0.1 " " " -0.1 " " " -100 -100 80 +7 -7 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 +PSRR -PSRR CMR 20 21 19 18 4003 17 -3.0 +3.0 -2.0 +2.0 -0.5 +0.5 -4.0 Min Max Min Max Min Max Min Max +4.0 " " " +40 " " " 250 " " " 250 " " " +100 +100 mV " " " nA " " " nA " " " nA " " " V/V V/V dB mV mV method 4001 Limits Limits Limits Limits
Symbol
MIL-STD
Test no.
Conditions
01, 02, 08 1/
03, 05 1/
04, 06 1/
07 1/
Unit
1 VIO
TA =
+25C
IIO
MIL-M-38510/101J
TABLE III. Group A inspection.
32
+IIB -IIB VIO ADJ (+) VIO ADJ (-)
Subgroup -883 VCC = 20 V dc, figure 3 unless otherwise specified 22 VCC = 15 V, t 25 ms VCC = 15 V, t 25 ms VCC = 15 V 5/ VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V VIO / T = [VIO (test 27) - VIO (test 3)] x 10 -15 +15 -15 " " " " +15 " " " " " " " -5.0 " " " " -4.0 +4.0 -3.0 +3.0 -1.0 +1.0 " " " +5.0 3.8 3.0 0.6 -6.0 " " " -50 +60 +60 +15 23 4005 4001 26 27 28 VIO / 6/ T IIO 31 VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V IIO / T = [IIO (test 32) - IIO (test 7)] x 10 " " -200 32 33 IIO / T +IIB 36 37 38 39 40 41 42 35 VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V 34 " 30 VCM = -15 V 2/ -30 +30 " " " +200 29 25 24 -60 -60 -15 -65 +65 8 +6.0 " " " +50 Min Max Min Max Min Max Min Max mA mA mA mV " " " V/C method 3011 Limits Limits Limits Limits
Symbol
MIL-STD
Test no.
Conditions
01, 02, 08 1/
03, 05 1/
04, 06 1/
07 1/
Unit
1 IOS (+) 4/ IOS (-) 4/ ICC VIO
TA =
+25C
2
See footnotes at end of table III.
-10 " " " -100 +10 " " " +100 -0.4 " " " -2.5 +0.4 " " " +2.5 -80 " " " -1,000 +80 " " " +1,000 " " " -0.1 " " " -0.1 " " " 110 " " " 110 " " " -0.1 " " " -0.1 " " " 75 " " " 75 " " " -1.0 " " " -1.0 " " " +2.0 " " " +2.0 " " " -0.1 " " " -0.1 " " " 250 " " " 250 " " " " " " -IIB " " "
TA =
+125C
MIL-M-38510/101J
TABLE III. Group A inspection - Continued.
33
nA pA/C nA nA
Subgroup -883 VCC = 20 V dc, figure 3 unless otherwise specified 43 VCC = 15 V, t 25 ms VCC = 15 V, t 25 ms VCC = 15 V +VCC = 10 V, -VCC = -20 V +VCC = 20 V, -VCC = -10 V VCM = 15 V 3/ 3/ -4.0 " " " -15 " " +15 " " " " -18 +4.0 -3.0 -5 -4 +3.0 " " " +18 -1.0 " " " -5.0 +1.0 " " " +5.0 -6.0 " " " -50 +5 +4 80 80 96 " " " " " " -100 +100 -100 +100 -16 +16 3.4 2.5 0.6 -150 " 80 +7 -7 +6.0 " " " +50 -4.0 " " " -20 +60 +60 +15 +65 7 +150 " -100 " 80 +5 -5 +4.0 " " " +20 44 4005 4003 47 4003 49 50 4001 VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V VIO / T = [VIO (test 3) - VIO (test 53)] x 12.5 52 53 54 55 51 48 46 45 -60 -60 -15 -65 Min Max Min Max Min Max Min Max Min -60 +60 3.4 +100" method 3011 Limits Limits Limits Limits Limits Max
Symbol
MIL-STD
Test no.
Conditions
01, 02 1/
03, 05 1/
04, 06 1/
07 1/
08 1/
Unit
2
IOS (+) 4/
mA mA mA V /V
TA =
IOS (-) 4/
+125C
ICC
See footnotes at end of table III.
56 VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V IIO / T = [IIO (test 7) - IIO (test 58)] x 12.5 57 58 59 60 -70 " " " -500 +70 " " " +500 -20 " " " -200 +20 " " " +200 -0.4 " " " -2.5 +0.4 " " " +2.5 -80 " " " -1,000 +80 " " " +1,000 -70 " " " -500 +70 " " " +500
+PSRR
-PSRR
CMR
dB mV
VIO ADJ(+)
MIL-M-38510/101J
TABLE III. Group A inspection - Continued.
34
VIO ADJ(-)
3
VIO
mV " " " V /C
TA =
-55C
VIO / 6/ T
IIO
nA " "
IIO / 6/ T
pA/C
Subgroup -883 VCC = 20 V dc, figure 3 unless otherwise specified 61 VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V VCM = -15 V 2/ VCM = +15 V 2/ VCM = 0 V VCC = 5 V, VCM = 0 V VCC = 15 V, t 25 ms VCC = 15 V, t 25 ms VCC = 15 V 5/ -100 -100 80 +5 -5 3/ +16 RL = 10 k RL = 10 k RL = 2 k RL = 2 k +15 -15 -16 +15 -15 +16 -16 +VCC = 10 V, -VCC = -20 V +VCC = 20 V, -VCC = -10 V VCM = 15 V 3/ -60 +60 4.2 +100 +100 -100 -100 80 +4 -4 +16 -16 +16 -16 +17 -17 " " " -60 +60 3.5 +100 +100 -16 -16 96 " " " " " " " " " -0.1 265 -0.1 100 -0.1 " " " -15 +15 0.8 +16 +16 -150 -150 80 +7 -7 " " " " " " " 3.0 " " " " " " " " " " " " " " " " " -0.1 " " " -65 80 9 +150 +150 62 63 64 65 66 67 68 3011 69 70 4005 4003 73 74 75 76 4004 78 79 80 77 72 71 -0.1 265 -0.1 100 -0.1 3.0 -0.1 Min Max Min Max Min Max Min Max 400 " " " 400 " " " nA " " " nA " " " mA mA mA V/V V/V dB mV mV V " " " method 4001 Limits Limits Limits Limits
Symbol
MIL-STD
Test no.
Conditions
01, 02, 08 1/
03, 05 1/
04, 06 1/
07 1/
Unit
3
+IIB
TA =
See footnotes at end of table III.
-55C
-IIB
MIL-M-38510/101J
TABLE III. Group A inspection - Continued.
35
IOS (+) 4/
IOS (-) 4/
ICC
+PSRR
-PSRR
CMR
VIO ADJ(+)
VIO ADJ(-)
4
+VOP
TA =
-VOP
+25C
+VOP
-VOP
Subgroup -883 VCC = 20 V dc, figure 3 unless otherwise specified 81 RL = 2 k, VOUT = +15 V RL = 2 k, VOUT = -15 V RL = 10 k, VOUT = +15 V RL = 10 k, VOUT = -15 V RL = 2 k, VCC = 5 V, VOUT = 2 V RL = 10 k, VCC = 5 V, VOUT = 2 V RL = 10 k RL = 10 k RL = 2 k RL = 2 k RL = 2 k, VOUT = +15 V RL = 2 k, VOUT = -15 V RL = 10 k, VOUT = +15 V RL = 10 k, VOUT = -15 V RL = 2 k, VCC = 5 V, VOUT = 2 V RL = 10 k, VCC = 5 V, VOUT = 2 V RL = 10 k RL = 10 k RL = 2 k RL = 2 k +15 -15 25 25 25 25 10 10 +16 -16 +15 -15 +15 -15 25 25 25 25 10 10 +16 -16 20 +16 -16 +16 -16 40 40 -16 +15 -15 32 32 32 32 10 10 +17 -17 +16 +16 -16 10 10 10 10 20 +16 -16 +16 -16 50 50 80 50 50 80 50 50 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 50 50 50 50 50 50 10 10 +17 -17 Min Max Min Max Min Max Min Max method 4004 Limits Limits Limits Limits
Symbol
MIL-STD
Test no.
Conditions
01, 02, 08 1/
03, 05 1/
04, 06 1/
07 1/
Unit
4 +AVS -AVS +AVS -AVS AVS AVS +VOP -VOP +VOP -VOP +AVS -AVS +AVS -AVS AVS AVS +VOP -VOP +VOP -VOP
V/mV " " " " " V " " " V/mV " " " " " V " " "
TA =
See footnotes at end of table III.
+25C
5
MIL-M-38510/101J
TABLE III. Group A inspection - Continued.
36
TA =
+125C
6
TA =
-55C
Subgroup -883 VCC = 20 V dc, figure 3 unless otherwise specified 101 RL = 2 k, VOUT = +15 V RL = 2 k, VOUT = -15 V RL = 10 k, VOUT = +15 V RL = 10 k, VOUT = -15 V RL = 2 k, VCC = 5 V, VOUT = 2 V RL = 10 k, VCC = 5 V, VOUT = 2 V Figure 4 Figure 4 0.3 0.3 80 15 40 800 25 0.3 0.3 800 TA = -55C, figure 4 TA = -55C, figure 4 TA = -55C, figure 4, AV = 1, VIN = -5 V to +5 V TA = -55C, figure 4, AV = 1, VIN = +5 V to -5 V 0.3 0.3 25 0.2 0.2 0.3 0.3 800 25 0.05 0.05 25 0.3 0.3 80 15 80 800 25 0.05 0.05 1,000 50 40 40 800 800 25 0.05 0.05 80 15 40 1,000 50 30 30 40 50 25 80 40 50 10 10 10 10 20 1,000 50 40 40 25 25 40 25 25 40 25 25 32 32 32 10 10 40 50 102 103 104 105 106 107 108 4002 Figure 4, AV = 1, VIN = -5 V to +5 V Figure 4, AV = 1, VIN = +5 V to -5 V Figure 5 BW = 5 kHz, figure 6 BW = 5 kHz, figure 6 110 111 112 113 114 TA = +125C, figure 4 TA = +125C, figure 4 TA = +125C, figure 4, AV = 1, VIN = -5 V to +5 V TA = +125C, figure 4, AV = 1, VIN = +5 V to -5 V 115 4002 117 118 119 4002 121 120 116 109 25 25 32 Min Max Min Max Min Max Min Max V/mV " " " " " ns % V/s V/s dB V rms V pk ns % V/s V/s ns % V/s V/s method Limits Limits Limits Limits
Symbol
MIL-STD
Test no.
Conditions
01, 02, 08 1/
03, 05 1/
04, 06 1/
07 1/
Unit
6 +AVS -AVS +AVS -AVS AVS AVS TR(tr) TR(OS) SR(+) SR(-) CS 7/
TA =
See footnotes at end of table III.
NI(BB) NI(PC) TR(tr) TR(OS) SR(+) SR(-) TR(tr) TR(OS) SR(+) SR(-)
-55C
7
TA =
MIL-M-38510/101J
TABLE III. Group A inspection - Continued.
37
+25C
8A
TA =
+125C
8B
TA =
-55C
Subgroup -883 VCC = 20 V dc, figure 3 unless otherwise specified Min Max Min Max Min Max 122 TA = +25C, figure 4 TA = +25C, figure 4 TA = +125C, figure 4 TA = +125C, figure 4 TA = -55C, figure 4 TA = -55C, figure 4 123 124 125 126 127 Min Limits Limits Limits method 4002 Limits Max 800 800 1,200 1,200 1,200 1,200
Symbol MIL-STD
Test no.
Conditions
01, 02, 08 1/
03, 05 1/
04, 06 1/
07 1/
Unit
12 tS(+) tS(-) tS(+) tS(-) tS(+) tS(-)
ns ns ns ns ns ns
TA =+25C
13A
TA =+125C
13B
MIL-M-38510/101J
TABLE III. Group A inspection - Continued.
38
TA =-55C
1/ For devices marked with the "Q" certification mark, the parameters listed herein may be guaranteed if not tested to the limits specified herein in accordance with the manufacturer's QM plan. Limits apply to both halves of dual devices (02, 05, 06, and 08) independently, and slew rate limit for device 08 is 0.4 V/s at all temperatures (tests 109, 110, 116, 117, 120, 121).
2/ VCM is achieved by algebraically subtracting the common mode voltage from each supply and algebraically adding the common mode voltage to V
(example, for VCM = -15 V, +VCC = +35 V, -VCC = -5 V, V = -15 V).
3/ VIO (ADJ) is not performed on device type 02, case I only, or on device types 04, 06, and 08 all case types.
4/ Due to the significant power dissipation and associated device heating, these tests shall always be the last tests performed in any given sequence, followed by operational
verification (example, such tests as VOPP, AVS, TR, SR).
5/ Limit shown applied to single devices (01, 03, and 04) only. The maximum quiescent ICC for dual devices (02, 05, 06, and 08) is twice that shown for single devices.
6/ Tests 29, 34, 55, and 60 which require a read and record measurement plus a calculation, may be omitted except when subgroups 2 and 3 are being accomplished for group A sampling inspection and group C and D endpoint measurements.
7/ Applies to device types 02, 05, and 06 only.
MIL-M-38510/101J
TABLE IV. Group C end point electrical parameters. (TA = +25C, VCC = 20 V, VCM = 0 V) Table III test no. Test Limit Min 3 11 15 VIO +IIB -IIB -3.0 +1.0 +1.0 Max +3.0 +110 +110 Min -0.5 -12 -12 01, 02, 08 Delta Max +0.5 +12 +12 Min -2.0 +1.0 +1.0 Limit Max +2.0 +75 +75 Min -0.5 -7.5 -7.5 03, 05 Delta Max +0.5 +7.5 +7.5 mV nA nA Unit
Table III test no.
Test Limit Min
04, 06 Delta Max +0.5 +2.0 +2.0 Min -0.25 -0.5 -0.5 Max +0.25 +0.5 +0.5 Min -4.0 +1.0 +1.0 Limit Max +4.0 250 250
07 Delta Min -1.0 -25 -25 Max +1.0 +25 +25
Unit
3 11 15
VIO +IIB -IIB
-0.5 -0.1 -0.1
mV nA nA
39
MIL-M-38510/101J
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. 4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MILPRF-38535 and herein for groups A, B, C, and inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. b. c. Subgroups 9, 10, and 11 shall be omitted. Tests shall be as specified in table II herein. Subgroups 12 and 13 (for device type 07 only) shall be added to table III of MIL-PRF-38535 for class S only. The class S sample size series for subgroup 12 shall be 5 and for subgroup 13 the class S sample size series shall be 7.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535. 4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. b. End point electrical parameters shall be as specified in table II herein. Subgroups shall be added to group C inspection and shall consist of subgroups 8, 12, and 13 respectively as specified in table III herein. The sample size series for subgroup 12 shall be 5, and subgroup 13 shall be 7 for class B devices (see MIL-PRF-38535, Appendix D). The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.
c.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point electrical parameters shall be as specified in table II herein. 4.5 Methods of inspection. Methods of inspection shall be specified and as follows. 4.5.1 Voltage and current. All voltage values given, except the input offset voltage (or differential voltage) are referenced to the external zero reference level of the supply voltage. Currents given are conventional current and positive when flowing into the referenced terminal. 4.5.2 Burn-in and life test cooldown procedure. When devices are measured at +25C following application of the steady state life or burn-in condition, they shall be cooled to within 10C of their power stable condition at room temperature prior to removal of the bias.
40
MIL-M-38510/101J
5. PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD personnel, these personnel need to contact the responsible packaging activity to ascertain requisite packaging requirements. Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Department of Defense Agency, or within the Military Department's System Command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
6. NOTES (This section contains information of a general or explanatory nature which may be helpful, but is not mandatory.) 6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. b. c. Title, number, and date of the specification. Complete part number (see 1.2). Requirements for delivery of one copy of the quality conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. Requirements for certificate of compliance, if applicable. Requirements for notification of change of product or process to acquiring activity in addition to notification of the qualifying activity, if applicable. Requirements for failure analysis (including required test condition of MIL-STD-883, method 5003), corrective action and reporting of results, if applicable. Requirements for product assurance options. Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements shall not affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the Government. Requirements for "JAN" marking.
d. e.
f.
g. h.
j.
6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists.
41
MIL-M-38510/101J 6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199. 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331. 6.6 Logistic support. Lead materials and finishes (see 3.4) are interchangeable. Unless otherwise specified, microcircuits acquired to Government logistic support will be acquired to device class B (see 1.2.2), and lead material and finish A (see 3.4). Longer length leads and lead forming shall not affect the part number. 6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M-38510 device types and may have slight physical variations in relation to case size. The presence of this information shall not be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535. Military device type 01 02 03 04 05 06 07 08 Generic-industry type 741A 747A (with common +VCC) LM101A LM108A LH2101A LH2108A LM118 1558
6.7 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of the changes. Custodians: Army - CR Navy - EC Air Force - 11 NASA - NA DLA - CC Review activities: Army - HD, MI, SM Navy - AS, CG, MC, SH, TD Air Force - 03, 19, 99 Preparing activity: DLA - CC Project 5962-1950
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STANDARDIZATION DOCUMENT IMPROVEMENT PROPOSAL
INSTRUCTIONS
1. The preparing activity must complete blocks 1, 2, 3, and 8. In block 1, both the document number and revision letter should be given. 2. The submitter of this form must complete blocks 4, 5, 6, and 7, and send to preparing activity. 3. The preparing activity must provide a reply within 30 days from receipt of the form. NOTE: This form may not be used to request copies of documents, nor to request waivers, or clarification of requirements on current contracts. Comments submitted on this form do not constitute or imply authorization to waive any portion of the referenced document(s) or to amend contractual requirements.
I RECOMMEND A CHANGE:
3. DOCUMENT TITLE
1. DOCUMENT NUMBER MIL-M-38510/101J
2. DOCUMENT DATE (YYYYMMDD) 2003/02/07
MICROCIRCUITS, LINEAR, OPERATIONAL AMPLIFIERS, MONOLITHIC SILICON, PART NUMBER M38510/10101 THROUGH M38510/10108 4. NATURE OF CHANGE (Identify paragraph number and include proposed rewrite, if possible. Attach extra sheets as needed.)
5. REASON FOR RECOMMENDATION
6. SUBMITTER a. NAME (Last, First Middle Initial) c. ADDRESS (Include Zip Code)
b. ORGANIZATION d. TELEPHONE (Include Area Code) (1) Commercial (2) DSN (If applicable) 7. DATE SUBMITTED (YYYYMMDD)
8. PREPARING ACTIVITY a. NAME Rick Officer c. ADDRESS (Include Zip Code) DSCC-VAS 3990 East Broad Street Columbus, Ohio 43216-5000
b. TELEPHONE (Include Area Code (1) Commercial (2) DSN 614-692-0518 850-0518 IF YOU DO NOT RECEIVE A REPLY WITHIN 45 DAYS, CONTACT: Defense Standardization Program Office (DLSC-LM) 8725 John J. Kingman Road, Suite 2533 Fort Belvoir, Virginia 22060-6221 Telephone (703)767-6888 DSN 427-6888
PREVIOUS EDITIONS ARE OBSOLETE.
DD Form 1426, FEB 1999 (EG)
WHS/DIOR, Feb 99

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